文章基本信息

标题：Deformation Twinning in Polycrystalline Mg Microstructures at High Strain Rates at the Atomic Scales
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作者：Garvit Agarwal ; Avinash M. Dongare
期刊名称：Scientific Reports
电子版ISSN：2045-2322
出版年度：2019
卷号：9
期号：1
页码：1-11
DOI：10.1038/s41598-019-39958-w
出版社：Springer Nature
摘要：Large scale molecular dynamics (MD) simulations are carried out to investigate the twinning behavior as well as the atomic scale micromechanisms of growth of tension and compression twins in polycrystalline Mg microstructures at high strain rates. A new defect characterization algorithm (extended-common neighbor analysis (E-CNA)) is developed that allows for an efficient identification of various types of twins in HCP microstructures. Unlike other local orientation analysis methods, the E-CNA method allows for atomic scale characterization of the structure of different types of twin boundaries in HCP microstructures. The MD simulations suggest that the local orientation of individual grains with the loading axis plays a critical role in determining the ability of grains to nucleate either compression twins or tension twins. The twinning behavior is observed through nucleation of a pair of planar faults and lateral growth of the twins occurs through nucleation of steps along the planar faults. The kinetics of migration of steps that determine the rate of growth of twins are investigated at the atomic scales. The twin tip velocity computed at high strain rates compares well with the experimentally reported values in the literature.